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00000cam a2200000 7i4500 |
| 001 |
0000031076 |
| 005 |
20180628.0 |
| 008 |
180625s2018 |
| 040 |
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|a JPA
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| 090 |
0 |
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|a D15608
|b HAR
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1 |
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|a Harzawardi bin Hasim
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| 245 |
1 |
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|a A study of thermal stability of different ZnO/p-Si diode structure toward application of radiation detectors[Thesis]
|c Harzawardi bin Hasim
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| 260 |
0 |
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|a Johor :
|b Faculty of Electrical Engineering,Universiti Teknologi Malaysia ,
|c 2018
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| 300 |
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|a xvi,60 pages ;
|c 30cm.
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| 336 |
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|a text
|2 rdacontent
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| 337 |
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|a unmediated
|2 rdamedia
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| 338 |
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|a volume
|2 rdacarrier
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| 500 |
0 |
0 |
|a Thesis
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| 502 |
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|a Master of Engineering
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| 610 |
1 |
0 |
|a Universiti Teknologi Malaysia
|x Dissertations
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| 650 |
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|a Dissertation, thesis, etc
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| 856 |
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|u http://ilmu.jpa.gov.my/document/0000031076.pdf
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| 999 |
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|a D000015608
|b THESIS AND DISSERTATIONS
|c REFERENCE
|e Default branch
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